Event Detectors for testing the reliability of electrical interconnects, including solder joints, wiring harnesses, and electrical connectors;
Semiconductor Thermal Analyzers for testing the thermal properties (thermal impedance and resistance) of packaged semiconductor devices;
Thermal Interface Material Testers in two categories; TIM Testers for testing thermal impedance, resistance, and conductivity on a wide variety of bulk materials, and a CTE Tester for testing co-efficient of thermal expansion (CTE) on a wide variety of bulk materials .